DevJobs

VLSI DFT engineer- Graduate position

Overview
Skills
  • ATPG
  • ATPG patterns
  • BIST
  • MBIST
  • SoC
  • DFT
  • Test plans
  • DRC
  • RTL simulations
  • Hierarchical design
  • Scan chains
  • SSN technology
  • Stuck-at faults
  • TAP controllers
  • Test program integration
  • Tester environments
  • Transition faults
  • VLSI ASIC development flow
  • Pattern deployment
  • Logic BIST
  • At-speed faults
  • GTL simulations
  • EDA tools
  • DFT IP blocks
  • DFT Compression
  • DFD
  • Clock Control blocks
  • Boundary scan
  • ATE environments
We are looking for a talented Graduate DFT engineer

As a DFT Engineer (Graduate) you will work closely with all other design teams – backend, verification and analog, fully responsible for defining, implementing, and deploying advanced design-for-test (DFT) methodologies for highly complex digital and mixed-signal chips. You will work on silicon test strategies, DFT/DFD, BIST for complex next generation SoCs.

Requirements:

Minimum qualifications:

  • Master's degree in electrical engineering from a well-known university.
  • Average grade above 85

Preferred qualifications:

  • Work experience in vlsi
  • Familiarity with EDA tools, dft concepts
  • Understanding of VLSI ASIC development flow
  • Excellent attention to detail, along with strong organizational, problem-solving, and communication skills.

Responsibilities:

  • Participate in implementing SoC DFT (ATPG/DFT/MBIST).
  • Work on hierarchical design and SSN technology.
  • Debug Design Rule Checks (DRC) and apply design fixes to achieve high test quality.
  • Insert DFT logic, including boundary scan, scan chains, DFT Compression, Logic BIST, TAP controllers, Clock Control blocks, and other DFT IP blocks.
  • Insert and integrate MBIST logic.
  • Run GTL and RTL simulations.
  • Work on and implement test plans for special analog IPs.
  • Support DFT ramp-up, test program integration, and pattern deployment in tester/ATE environments.
  • Generate, verify, and optimize ATPG patterns (stuck-at, at-speed, and transition faults) to maximize test coverage.
  • Document DFT working processes.
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